Used and Refurbished Integrated Circuit Test and Sorting Equipment
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MCT
LS 2600
-
$500 AS IS
MCT -
LS 2600:
Lead Scanner.
The Model LS 2600 is a lead scanner for 600 mil devices. The 2600 scanner can test up to 5,000 devices per hour . A sort verification system on the 2600 compares the actual output reservoir selected with the original category signal selection command from the scanner module.
Inventory#:
30762 View
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MCT -
2608:
Elevated Temp. I.C. Handler.
Gravity feed with Air assist.
Input: 13 heated reservoirs (24 in. long) accepts any single track stick.
Output: 8 reservoirs (24: long) accepts any single track A or B frame stick.
Dip size: 600 mil. 8 programmable sort categories (sort signal can be +/-TRUE at 3.5V min. to 30V max. w/5 msec min. width). Handler supplies test ready signal to the tester at +/-TRUE.
Homogeneous gold platinum alloy contacts: 0.050 ohms. Interlead capacitance of 5 pf (kelvin) 3 pf (non Kelvin). Temp. control range is from ambient to 125 deg. C +/- 12 deg. C.
Requires: 200 CFH Air at 20 PSI; 105-125V, 50/60 Hz at 18A max., weight 125 lbs.
Inventory#:
23617 View
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TEKTRONIX -
178:
Linear IC Test Fixture.
For use with 577 Curve Tracer System. Tests single, dual or quad.
Operational amplifiers, comparators, regulators, more.
Inventory#:
9757 View
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SYMTEK -
7936 HD:
Dual Magnum Environmental Handler.
The Model 7936 HD is an environmental dual handler for .300, .400, .600 naked dips, designed to improve throughput by providing parallel test capabilities for devices with long test times.
Throughput: 5000 devices per hour.
Sorter: Five sorts of two sleeve reservoirs each, two reservoirs for handler retest parts.
Hot Only: 25 deg. C to +150 deg. C.
Requires: 120V, 50/60 Hz.
Inventory#:
39900 View
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FLEXION -
AP-1:
Liquid Cryogen Cooled Wafer Prober.
Capable of positioning and contact probing pre-mounted wafers or integrated arrays.
High vacuum turbo pumped test environment.
Device test temp 78K - 400K using LN2.
Inventory#:
42468 View
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TRIO-TECH -
ARTIC M MS160:
Temperature Controlled Test Chuck.
Designed for characterization and failure analysis of chips and hybrids at high and low temperatures.
Artic M test head with a temperature controlled area of 6 in. x 4 in.
TC1000 digital PID temperature controller with touch screen operation and IEEE and RS232 interfaces.
Range: -45 to 80 deg C.
Response Time: -45 to +80 deg C 6 minutes.
Inventory#:
46696 View
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