JEOL -
JWS-7515:
In-Line Wafer Inspection Electron Microscope.
Field emission electron gun.
Oxford ISIS EDS detector with cryo compressor (LN2 free operation).
Resolution: 8 nanometer.
Magnification: 100X to 200,000X.
Accelerating voltage up to 12 kV.
4 axes goniometer stage.
Inventory#:
49809 View
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JEOL -
JWS-7555:
Wafer Inspection SEM.
Cassette to robot handling.
Magnification to 200,000.
Specimen Stage: 4 axis goniometer with 200 mm X-Y travel and tilt -15 to 60 degrees.
Field emission electron gun.
Date of Mfg.: 1999. CE marked.
Inventory#:
52567 View
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JEOL -
JSM-5400:
Multi-Purpose Digital SEM.
Comes with EDS System at no extra cost, EDS System is not tested or guaranteed.
Resolution: 4.0 nm.
Accelerating Voltage: 0.5 to 30 kV.
Magnification: X15 to 200,000X.
For various purposes ranging from high resolution morphological observation of
microscopic surfaces to elementary analysis.
100V, 1 Ph, 50/60 Hz, 25A.
Inventory#:
52701 View
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JEOL -
JWS-7515:
In-Line Wafer Inspection Electron Microscope.
Field emission electron gun.
EDS detector with cryo compressor (LN2 free operation).
Resolution: 8 nm.
Magnification: 100X to 200,000X.
Accelerating voltage up to 12 kV.
4 axis goniometer stage.
Inventory#:
52702 View
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JEOL -
JWS-7555:
Wafer Inspection SEM with X-Ray Detector.
Resolution: 5 nm.
Magnification: 100X to 200,000X.
Field emission electron gun.
X-Y Stage Travel: 200 mm.
$99,000 Refurbished.
Inventory#:
52718 View
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