PERKIN ELMER -
Plasma II:
Inductively Coupled Plasma Emission Spectrometer.
Utilizes two separate one meter Ebert monochromators operating totally independent of the other, providing high speed of analysis of up to 50 elements/min. Long-term wavelength stability unequaled; wavelength calibration can be verified by use of a built-in low pressure Hg light source. Incorporates a Myers-Tracy Signal Compensation System to correct for signal variations due to short-term noise and signal fluctuations. System completely thermostatted and vibration isolated. Customized laboratory reports can be generated, in which all data or selected results can be summarized with results listed by element or by sample.
Inventory#:
28864 View
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PHILIPS -
PW-1410/70:
X-Ray Fluorescence Spectrometer.
With XRG-3000 X-Ray Generator and Data processor.
Scanning range: Scintillation counter from 0 deg. to 116 deg. (2 theta).
Flow counter from 0 deg. to + 148 deg. (2 theta).
Reading accuracy: 0.005 deg. (2 theta).
Reproducibility: 0.003 deg. (2 theta).
Maximum sample thickness: 42 mm (1 5/8 in.).
Maximum sample diameter: 2 in. (50.8 mm).
Sample rotation: 60 rpm.
Power Requirements - Voltage: 195V min. to 245 V max.
Frequency: 60 Hz.
Output Characteristics - Voltage range: Output is variable
from 15 kV to 60 kV at 80 mA DC or less as limited by 3 kW max. output power.
Output voltage: Output voltage is full wave rectified and filtered.
Inventory#:
25410 View
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EG&G -
1451:
Plasma Monitor w/Jarrell Ash Spectrometer and a 1454 Detector.
The most sensitive 1451 system detector is the Model 1454a 512-channel intensified diode array providing detection levels of approximately 100 photons per A/D count.
The wavelength response of the 1454 is limited by the intensifier to the range of 365 nm to 800 nm.
Inventory#:
23652 View
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PERKIN ELMER -
Optima 3000 DV:
Dual View ICP Optical Emission Spectrometer.
Dual viewing allows user to view plasma either axially or laterally.
Two detectors one for UV range 167 to 375 nm and one for visible range 375 to 782 nm.
With AS90 Autosample and Peristalic Pump.
200-240V, 1 Ph, 50/60 Hz.
CE Marking.
Inventory#:
41741 View
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JORDAN VALLEY -
EDXRF/XRD EX-6600:
Energy Dispersive X-Ray Fluorescence Spectrometer.
High levels of sensitivity and selectivity. Delivers rapid determinations
for trace and minor constituents in difficult samples, with typical MDL’s of 1 ppm or less.
Analyze fluorine through uranium with or without standards from parts per billion to high weight percents.
Inventory#:
47253 View
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SPECTRO -
SPECTROFLAME-ICP:
Emission Spectrometer.
Low limits of detection and speed of analysis.
The high temperature of the plasma makes it possible to atomize difficult elements such as boron, tantalum, titanium, tungsten and reach low detection limits for these elements.
Missing PC and software. AS IS with 30 day right to return.
Inventory#:
49359 View
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FINNIGAN MAT -
GCQ:
Ion Trap Mass Spectrometer Coupled to a Gas Chromatograph.
Versatile and ultra-sensitive analytical technique giving you all the benefits of an electron capture detector, plus mass spectra with extremely low background and high signal to noise for outstanding detection and quantitation. Includes A200S autosampler and the Raytest gas radiochemical detector.
Also includes direct probe controller.
Inventory#:
50403 View
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VARIAN -
SpectrAA-400:
Atomic Absorption System.
Older system.
Sold AS IS, working condition unknown.
30 Day right to return.
Inventory#:
52607 View
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THERMO QUEST -
FINNIGAN LCQ Duo:
Benchtop Mass Spectrometer for LC/MS/MS.
Ion trap mass spectrometer.
Computer and software not included.
Must purchase from OEM.
Inventory#:
52679 View
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RHEOMETRICS -
RDS-II:
Dynamic Spectrometer.
The RDS-II uses dynamic mechanical analysis to evaluate materials.
Solids, melts or viscous liquids are subjected to a precisely controlled deformation (strain) history and the stress response of the sample is observed.
The sample response can be seperated into viscous and elastic components.
Inventory#:
53496 View
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RHEOMETRICS -
RDS-II:
Dynamic Spectrometer.
The RDS-II uses dynamic mechanical analysis to evaluate materials.
Solids, melts or viscous liquids are subjected to a precisely controlled deformation (strain) history and the stress response of the sample is observed.
The sample response can be seperated into viscous and elastic components.
Inventory#:
53558 View
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SPECTRO -
SPECTROIL JR+:
Optical Emission Spectrometer.
Specifically designed for the analysis of metals inlubricating oil and contaminants in gas turbine fuels.
115/220V, 50/60 Hz.
Inventory#:
53096 View
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SPEX -
1702/04:
.75 Spectrometer.
No detector with system, photomultiplier housing only.
Spectrometer only, no other parts. Grating: 600 grooves mm.
Inventory#:
54313 View
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unless otherwise stated. For full details of this policy,
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