SOFTEX -
ISV-100W:
X-Ray Imaging System.
8 x 6 in. X-Y stage.
X-Ray TV camera.
Hitachi monitor.
100 KVP source.
Sony digital printer.
120V, 50/60 Hz.
Inventory#:
26876 View
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PHILIPS -
PW-1410/70:
X-Ray Fluorescence Spectrometer.
With XRG-3000 X-Ray Generator and Data processor.
Scanning range: Scintillation counter from 0 deg. to 116 deg. (2 theta).
Flow counter from 0 deg. to + 148 deg. (2 theta).
Reading accuracy: 0.005 deg. (2 theta).
Reproducibility: 0.003 deg. (2 theta).
Maximum sample thickness: 42 mm (1 5/8 in.).
Maximum sample diameter: 2 in. (50.8 mm).
Sample rotation: 60 rpm.
Power Requirements - Voltage: 195V min. to 245 V max.
Frequency: 60 Hz.
Output Characteristics - Voltage range: Output is variable
from 15 kV to 60 kV at 80 mA DC or less as limited by 3 kW max. output power.
Output voltage: Output voltage is full wave rectified and filtered.
Inventory#:
25410 View
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DAINI SEIKOSHA -
SFT/156:
Fluorescent X-Ray Measurement System.
X-Y Stage: 3 in. x 3 in.
Travel Z.
Adjustment: 1.3 in. Min.
Measurement area: .005 in.
Inventory#:
34297 View
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VEECO -
XRF-330AT:
X-Ray Fluorescence Surface Measurement System.
PC Controlled.
Plating thickness measuring system.
12 in. x 16 in. x 1 in. XYZ programmable.
Motorized stage joystick.
Focal spot 0.2 mm.
120/240V, Single Phase, 50/60Hz, 5/2.5A.
Inventory#:
29246 View
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JORDAN VALLEY -
EDXRF/XRD EX-6600:
Energy Dispersive X-Ray Fluorescence Spectrometer.
High levels of sensitivity and selectivity. Delivers rapid determinations
for trace and minor constituents in difficult samples, with typical MDL’s of 1 ppm or less.
Analyze fluorine through uranium with or without standards from parts per billion to high weight percents.
Inventory#:
47253 View
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PHILIPS -
PLM-100:
Photoluminescence Mapping Tool.
For process control, analysis of band-gap, ternary layer composition,
layer thickness and crystal perfection.
Inventory#:
48787 View
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BEDE -
QC200 Type B:
High Resolution X-Ray Diffractometer.
Compact high resolution double crystal diffractometer.
Horizontal specimen mounting on detachable holders, up to 200mm sample size.
110V, 50/60 Hz.
X-RAY TUBE BAD. NEEDS NEW TUBE. SOLD AS IS.
Inventory#:
54357 View
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JEOL -
JWS-7555:
Wafer Inspection SEM with X-Ray Detector.
Resolution: 5 nm.
Magnification: 100X to 200,000X.
Field emission electron gun.
X-Y Stage Travel: 200 mm.
$99,000 Refurbished.
Inventory#:
52718 View
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