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Applied Materials Inventory in Stock
| Manufacturer/Model |
Description |
Info
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APPLIED MATERIALS
EXCITE |
High Speed Particle Detection System for Bare Wafer or Patterned Wafer Inspection.
Inspects device wafers after processing is completed or inspects blanket films.
Blanket films can be inspected at over 60 wafers per hour and patterned wafers at over 45 wph.
.1µm particle detection on unpatterned silicon.
Windows NT operating system.
Currently configured for 200mm wafers but can be configured for 300mm.
Date of Mfg. 2003.
$49,000 |
View Details and Photo
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APPLIED MATERIALS
HDP |
Etch Chamber.
$79,000 |
View Details and Photo
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APPLIED MATERIALS
Ozonator |
Ozone generator for Applied Materials P5000.
208V, 3 Ph, 20A..
$4,950 |
View Details and Photo
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