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Nanometrics Inventory in Stock:

Manufacturer/Model Description

Info
NANOMETRICS  010-0180 Nanospec AFT Film Thickness Measurement System. Microspectrophotometer head can measure in wavelength range: 480 to 790 nm. Standard films measured: nitrides, oxides, polyimides, negative and positive resists, silicon dioxide and nitride. Measures from 400 to 40,000 angstroms.. $6,500 View Details and Photo
NANOMETRICS  010-0181 Computerized Film Thickness Measurement System. Microspectrophotometer head can measure in the wavelength range of 480 to 790 nm. Standard films measured silicon dioxide and nitride, negative and positive resists, nitrides, oxides and polyimides. Measures from 400 to 40,000 angstroms. 115V, 50/60 Hz.. $6,500 View Details and Photo
NANOMETRICS  210 Thin Film Measurement System. Fast measurement scan of 2.5 secs. Measurement Range: 100 to 500,000 angstroms. Reflectivity program. 117V, 50/60 Hz.. $15,000 View Details and Photo
NANOMETRICS  210 Thin Film Measurement System. Microspectrophotometer head produces stable accurate measurements. Measurement Scan: 2.5 secs. Measrurement Range: 100 to 500,000 angstroms. 115V, 60 Hz.. $15,000 View Details and Photo
NANOMETRICS  4000 Tabletop Film Thickness Measurement System. Precision film thickness measurement. Absolute reflectivity. Refractive index. Small spot size. High resolution spectrophotometer scanning system. Standard film types measured: single layer films 500 to 50,000 angstroms. Double layer films top layer: 100 to 30,000 angstroms, bottom layer 100 to 10,000 angstroms. 115V, 60 Hz.. $22,500 View Details and Photo

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