|
Phone: 732-863-9500
FAX: 732-863-1255
Email:
Sales |
|
Have equipment
sitting idle?
We're always
in the market for quality high-tech equipment!
Click Here! |
| |
Prometrix Inventory in Stock:
| Manufacturer/Model |
Description |
Info
|
|
|
PROMETRIX
C2C |
Wafer Loader for Cassette to Cassette Operation of Prometrix Tabletop Systems.
Cassette to cassette handler.
No flat finder..
$3,950 |
View Details and Photo
|
|
PROMETRIX
FT-530 |
Film Thickness Mapping System.
Measures single or multiple layers of oxide, nitride, photoresist, polysilicon and other
optically transparent films from less than 100 angstrom to greater than 4 mm.
Analysis Capabilities: Mapping: Contour, 3-D and Die Maps.
Scanning: Diameter Scan.
Sampling: Quick Tests; user-definable tests.
Average, difference and ratio maps. Process control charts.
Statistical Calculations. Database management. Correlation Curves.
Standard Wafer Sizes: 3-3.25 in. and 100, 125, 150, 200 mm..
$12,000 |
View Details and Photo
|
|
PROMETRIX
RS35C |
Resistivity Mapping System Four Point Probe.
The OmniMap collects and analyzes sheet resistance data on various conductive layers such as implants, diffusions, epi, CVD, metals and bulk substrates. Provides accurate and repeatable sheet resistance measurements from 5m ohms/sq to 5m ohms/sq on 2 in. (50mm) to 8 in. (200mm) wafers by uniting sophisticated modeling algorithms, advanced analysis techniques and precision electronics. Measures up to 1264 sites per wafer using standard or user-defined patterns, and displays test results in the form of contourmaps, 3-D maps, diameter scans and die maps. .
$25,000 |
View Details and Photo
|
|
PROMETRIX
UV-1050 |
Film Thickness Mapping System.
Fully automated system produces highly accurate, precise, and stable measurements of film
thickness, reflectivity, and refractive index on monitor and patterned wafers.
Window based software with Stattrax® Statistical Tracking Software..
$49,000 |
View Details and Photo
|
|
