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Tencor Inventory in Stock:

Manufacturer/Model Description

Info
TENCOR  Auto RS55/TC Four Point Probe Resistivity Mapping System with Temperature Compensation and Wafer Handler. Stainless steel clean room version. Cassette to cassette measurement. Display modes include contour maps, 3-D plots and diameter scans. Can compensate sheet resistance measurements against ambient temperature and materials TCR. Accommodates wafers up to 200 mm. 115V, 50/60 Hz.. $39,500 View Details and Photo
TENCOR  FLX-2908 900 deg C Thin Film Stress Measurement System. Provides accurate analysis of thin film stress with very low measurement noise. Allows observation and quantitative evaluation of stress relaxation, oxide densification, thin film phase transformations and annealing. Scan range user programmable up to 200mm. Wafer Sizes: 125, 150, 200mm. 230V, 1 Ph, 60 Hz, 30A.. $39,500 View Details and Photo
TENCOR  FLX-2908 900 deg C Thin Film Stress Measurement System. Provides accurate analysis of thin film stress with very low measurement noise. Allows observation and quantitative evaluation of stress relaxation, oxide densification, thin film phase transformations and annealing. Scan range user programmable up to 200mm. Wafer Sizes: 125, 150, 200mm. 230V, 1 Ph, 60 Hz, 30A.. $39,500 View Details and Photo
TENCOR  P-10 High Precision Surface Profiler. Provides high precision surface topography measurements on a wide variety of substrates. Quickly characterize step heights, roughness, waviness, radius of curvature and a range of geometric features. Scan Length: 60mm. 115V, 50/60 Hz, CE. This used Tencor P10 High Precision Surface Profiler will be sold refurbished and fully tested to meet the original manufacturers specifications. Due to the very large inventory Bid Service warehouses at its 150,000 Sq. Ft. facility, we do not begin to refurbish an item until a purchase order has been placed. We recommend you talk to a salesperson to find out what the approximate lead time may be on that item or items. The second hand Tencor P10 High Precision Surface Profiler is owned by us and stored in our Freehold, NJ facility. You are welcome to visit and inspect our used equipment in person. We recommend you call for an appointment first so that we can organize your visit. The used Tencor P10 High Precision Surface Profiler will come with both our 30 day money back policy and our 90 day parts warranty to ensure your full satisfaction with your purchase excluding any shipping charges. If you purchase this tool at a reduced price or any product we have listed in AS IS condition, the 30 day right to return and the 90 day warranty will no longer apply.. $27,500 View Details and Photo
TENCOR  P20H Long Scan Profiler. Measurement of vertical features ranging from under 100 Angstroms to approximately 0.3mm, with a vertical resolution of 1 or 25 Angstroms. Ability to fit and level data, allowing accurate measurements on curved surfaces. Handles wafers from 3 in. to 8 in. Full 8 in. scanning Can scan up to 25 wafers without operator intervention.. $39,000 View Details and Photo
TENCOR  SURFSCAN 6100 Unpatterned Wafer Surface Contamination Analyzer. Submicron sensitivity, detects 0.16 micron particles. Instantaneous magnified 3-D views of individual defects.Color coded defect maps, histograms and other graphics. Surface haze detection. Capable of handling 4 in., 5 in. and 6 in. wafers.. $39,000 View Details and Photo
TENCOR  SURFSCAN 6100 Unpatterned Wafer Surface Contamination Analyzer. Submicron sensitivity, detects 0.16 micron particles. Instantaneous magnified 3-D views of individual defects. Color coded defect maps, histograms and other graphics. Surface haze detection. Capable of handling 4, 5 and 6 in. wafers.. $39,000 View Details and Photo
TENCOR  SURFSCAN 6200 Wafer Surface Analysis System For Non-Patterned Wafers. Can accommodate wafers from 2 to 8 in. dia. Sensitivity - Particle: .117 micro-meter dia. latex spheres with >90 percent capture rate. Haze: .1 ppm minimum. Cassette to cassette handling. Supplies enlarged 3D images, scan prints for quick analysis.. $49,000 View Details and Photo
TENCOR  SURFSCAN AIT Model 8010 Advanced In-Line Defect Inspection System. Automated full wafer inspection system for detecting particles as small as 0.10 micro-meters on bare silicon and patterned process wafers. High detection sensitivity even for difficult after-etch, develop, and chemical mechanical polishing. High throughput of up to 30 full wafer scans per hour on 200mm wafers.. $49,000 View Details and Photo
TENCOR  UV-1250SE Combination UV Spectroscopic Ellipsometry and Broadband UV Spectrophotometry Thin Film Measurement System. Combines spectroscopic ellipsometry technology with broadband ultraviolet (UV) spectrophotometry. Allows the user to obtain unique simultaneous multi-layer/simultaneous multi-variable measurements, which include thickness, refractive index, and extinction coefficients, with excellent accuracy.. $BEST OFFER! View Details and Photo
TENCOR  UV-1250SE Parts Unit Thin Film Measurement System. PARTS UNIT CALL FOR DETAILS. Sell Parts or Whole System.. $- View Details and Photo

All items are covered by our 30-Day Right of Return and 3-Month Warranty unless otherwise stated. For full details of this policy, click here!

Note: All manufacturers names and models are used for illustrative purposes only. Any trademarks, tradenames or copyrights remain solely the property of the manufacturer. Unless otherwise stated, all items are used, and Bid-Service is not a manufacturer authorized representative. All images are copyright 2001-2011 Bid-Service LLC/Sci-Quip and may not be used for any purpose without prior written permission